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Analyzer of jeweler scrap EDX980X-ray fluorescent spectrometer of EDX 980 XRF the specialized analyzer of jeweler scrap for testing of internal walls of jewelry. High-precision silicon Si PIN the detector is used. The platform for a sample changes the position on axis Z, allowing to analyze remote areas of a sample. It is supplied with the laser index for achievement of high precision of positioning of a x-ray spot.
Detection of precious metals, such as gold, silver, platinum, palladium of ornament and other jewelry.Technical characteristics
- The measured elements: Cu, Au, Pt, Ag, etc.
- Repeatability: 0.1%
- Surrounding temperature: 15-30 °C
- Testing time: 60 - 100 sec.
- Food: alternating current 220B ± 5B
- The detecting block with the proportional counter (higher resolution does test results by more exact)
- Source of x-ray radiation: 50 kV, 1ma
- Collimator: F1mm and F2mm (automatic switching)
- Chamber for a sample: Top illumination
- Platform for a sample: mechanical Adjustment of height; accuracy of positioning of axis Z of a platform reaches 0,02 mm
- Protective system: automatic switching off of a high voltage if the top cover suddenly opens
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